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[D-9-05] An Electrothermal Compact Model of SiC MOSFETs for Simulating Unclamped Inductive Switching Tests

〇Kyohei Shimozato¹, Yohei Nakamura¹, Song Bian¹, Takashi Sato¹ (1. Kyoto University(Japan))

https://doi.org/10.7567/SSDM.2020.D-9-05