Estimation of Seebeck Coefficient of Si Wire Laterally Lying on Oxide-Covered Substrate

Kazuaki Katayama

doi:https://doi.org/10.7567/SSDM.2020.F-2-04

16:45 〜 17:00

[F-2-04] Estimation of Seebeck Coefficient of Si Wire Laterally Lying on Oxide-Covered Substrate

〇Kazuaki Katayama¹, Md Mehdee Hasan Mahfuz¹, Motohiro Tomita¹, Shuhei Hirao¹, Sakika Tanabe¹, Takashi Matsukawa², Takeo Matsuki^1,2, Hiroshi Inokawa³, Hiroya Ikeda³, Takanobu Watanabe¹ (1. Waseda University(Japan), 2. AIST(Japan), 3. Shizuoka University(Japan))

https://doi.org/10.7567/SSDM.2020.F-2-04

2020 International Conference on Solid State Devices and Materials

[F-2-04] Estimation of Seebeck Coefficient of Si Wire Laterally Lying on Oxide-Covered Substrate