17:15 〜 17:30

[F-2-06] Inelastic X-ray Scattering Measurement on SiGeSn Polycrystalline Alloy

〇Yosuke Shimura^1,2, Kako Iwamoto¹, Ryo Yokogawa^3,4, Motohiro Tomita⁵, Hirokazu Tatsuoka¹, Hiroshi Uchiyama⁶, Atsushi Ogura^3,4 (1. Shizuoka Univ.(Japan), 2. Res. Inst. Electron.(Japan), 3. Meiji Univ.(Japan), 4. MREL(Japan), 5. Waseda Univ.(Japan), 6. JASRI(Japan))

https://doi.org/10.7567/SSDM.2020.F-2-06