15:15 〜 15:30

[F-9-06] Identification of deep level defects in CdTe solar cells using transient photo capacitance spectroscopy

〇Chuang Li^1,2, Xia Hao¹, Yulu He², Jingquan Zhang¹, Lili Wu¹, Wei li¹, Wenwu Wang¹, Lianghuan Feng¹, Islam Muhammad Monirul², Katsuhiro Akimoto², Takeaki Sakurai² (1. Sichuan Univ.(China), 2. Univ. of Tsukuba(Japan))

https://doi.org/10.7567/SSDM.2020.F-9-06