2:00 PM - 2:15 PM

[H-5-01] Nano-scale characterization of few-layer hexagonal boron nitride with scattering-type scanning near-field optical microscopy

〇Makoto Takamura¹, Yoshitaka Taniyasu¹ (1. NTT Corp., NTT Basic Res. Labs.(Japan))

https://doi.org/10.7567/SSDM.2020.H-5-01