14:00 〜 14:15
[H-5-01] Nano-scale characterization of few-layer hexagonal boron nitride with scattering-type scanning near-field optical microscopy
〇Makoto Takamura1, Yoshitaka Taniyasu1
(1. NTT Corp., NTT Basic Res. Labs.(Japan))
https://doi.org/10.7567/SSDM.2020.H-5-01