Readout of Charge States in a Physically Defined PMOS Silicon Quantum Dot via RF Reflectometry

Sinan Bugu

doi:https://doi.org/10.7567/SSDM.2020.I-6-02

16:30 〜 16:45

[I-6-02] Readout of Charge States in a Physically Defined PMOS Silicon Quantum Dot via RF Reflectometry

〇Sinan Bugu¹, Shimpei Nishiyama^1,2, Kimihiko Kato², Yongxun Liu², Takahiro Mori², Tetsuo Kodera¹ (1. Tokyo Inst. of Tech.(Japan), 2. National Inst. of Advanced Indus. Sci. and Tech.(Japan))

https://doi.org/10.7567/SSDM.2020.I-6-02

2020 International Conference on Solid State Devices and Materials

[I-6-02] Readout of Charge States in a Physically Defined PMOS Silicon Quantum Dot via RF Reflectometry