4:45 PM - 5:00 PM

[I-6-03] Mechanism of Gate-Length Dependence of Quantum Dot Operation in Isoelectronic-Trap-Assisted Tunnel FETs

〇Shota Iizuka¹, Hidehiro Asai¹, Kimihiko Kato¹, Junichi Hattori¹, Koichi Fukuda¹, Takahiro Mori¹ (1. AIST(Japan))

https://doi.org/10.7567/SSDM.2020.I-6-03