4:45 PM - 5:00 PM
[J-2-04] Fabrication of Indium-Tin-Oxide Channel Ferroelectric-Gate Thin Film Transistors using Yttrium Doped Hafnium-Zirconium Dioxide by Chemical Solution Process.
〇Mohit -1, Takaaki Miyasako2, Eisuke Tokumitsu1
(1. JAIST (Japan), 2. Murata Manufac. Co., Ltd(Japan))
https://doi.org/10.7567/SSDM.2020.J-2-04