The Japan Society of Applied Physics

11:45 〜 12:00

[J-4-03] The Use of a Patterned NiO Capping Layer to Improve Photoresponsivity of Ultraviolet Photodetectors Based on IGZO Field Effect Diodes<gdiv></gdiv>

〇Meng-Yung Su1, Shui-Jinn Wang1, Rong-Ming Ko2 (1. Inst. of Microelectronics, Dept. of Electrical Engineering, National Cheng Kung University(Taiwan), 2. College of Electrical Engineering and Computer Science, National Cheng Kung University(Taiwan))

https://doi.org/10.7567/SSDM.2020.J-4-03