16:45 〜 17:00

[K-2-04] Low-Temperature Solid-Phase Crystallization of SiSn on Insulator - Effects of Sn Concentration and Film Thickness -

〇Tomohiro Kosugi¹, Kazuki Yagi¹, Taizoh Sadoh¹ (1. Kyushu Univ.(Japan))

https://doi.org/10.7567/SSDM.2020.K-2-04