11:45 〜 12:00

[K-4-03] Structural and Luminescence Characteristics of Trench Defects in Red-emitting InGaN/GaN on Single-crystal GaN Substrate

〇Takashi Tange¹, Taeko Matsukata¹, Takumi Sannomiya¹ (1. Tokyo Tech(Japan))

https://doi.org/10.7567/SSDM.2020.K-4-03