4:43 PM - 4:50 PM

[A-6-06] A Robust Single Device MOSFET Series Resistance Extraction Method Considering Horizontal-Field-Dependent Mobility

〇Kiyoshi Takeuchi¹, Tomoko Mizutani¹, Takuya Saraya¹, Masaharu Kobayashi¹, Toshiro Hiramoto¹ (1.Univ. of Tokyo)

https://doi.org/10.7567/SSDM.2021.A-6-06