3:45 PM - 4:15 PM

[B-6-01 (Invited)] Technology Challenge and Opportunity of HfO₂-based FeFET Memory

〇Masaharu Kobayashi¹, Fei Mo¹, Jiawen Xiang¹, Jixuan Wu¹, Takuya Saraya¹, Toshiro Hiramoto¹ (1.The Univ. of Tokyo)

https://doi.org/10.7567/SSDM.2021.B-6-01