16:15 〜 16:22

[D-2-02] Improvement of Qrr-IDSS and dynamic avalanche of field-plate MOSFETs by local lifetime control on the cathode side

〇Yusuke KOBAYASHI¹、Tatsuya Nishiwaki²、Akihiro Goryu^1,2、Tsuyoshi Kachi²、Ryohei Gejo²、Hiro Gangi¹、Tomoaki Inokuchi¹、Kazuto Takao¹ (1.Toshiba Corp.、2.Toshiba Electronic Devices & Storage Corp.)

https://doi.org/10.7567/SSDM.2021.D-2-02