4:29 PM - 4:36 PM

[D-2-04] Effect of k-means Clustering for Analysis of Power Cycle Test Waveforms on Failure Prediction

〇Ryosuke Okachi¹, Katsuhiro Kutsuki¹, Junya Muramatsu¹, Masataka Deguchi² (1.Toyota Central R&D Labs., Inc., 2.DENSO Corp.)

https://doi.org/10.7567/SSDM.2021.D-2-04