09:51 〜 09:58
[D-7-05] Comparative study of breakdown and interface properties of gate insulator on N-polar and Ga-polar GaN MIS capacitor
〇Takahiro Gotow1、Tatsushi Suka1、Yasuyuki Miyamoto1
(1.Tokyo Institute of Technology)
https://doi.org/10.7567/SSDM.2021.D-7-05