The Japan Society of Applied Physics

9:51 AM - 9:58 AM

[D-7-05] Comparative study of breakdown and interface properties of gate insulator on N-polar and Ga-polar GaN MIS capacitor

〇Takahiro Gotow1, Tatsushi Suka1, Yasuyuki Miyamoto1 (1.Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.2021.D-7-05