The Japan Society of Applied Physics

4:43 PM - 4:50 PM

[H-6-06] Universal Method on Charge Carrier Mobility and Series Resistance Extraction in Two-Dimensional Field-Effect Transistors

〇Yu-Chieh Chien1, Xuewei Feng1, Kai-Chun Chang2, Wee Chong Tan1, Sifan Li1, Li Chen1, Li Huang1, Kah-Wee Ang1 (1.National Univ. of Singapore, 2.National Sun Yat-Sen Univ.)

https://doi.org/10.7567/SSDM.2021.H-6-06