Universal Method on Charge Carrier Mobility and Series Resistance Extraction in Two-Dimensional Field-Effect Transistors

Yu-Chieh Chien

doi:https://doi.org/10.7567/SSDM.2021.H-6-06

16:43 〜 16:50

[H-6-06] Universal Method on Charge Carrier Mobility and Series Resistance Extraction in Two-Dimensional Field-Effect Transistors

〇Yu-Chieh Chien¹、Xuewei Feng¹、Kai-Chun Chang²、Wee Chong Tan¹、Sifan Li¹、Li Chen¹、Li Huang¹、Kah-Wee Ang¹ (1.National Univ. of Singapore、2.National Sun Yat-Sen Univ.)

https://doi.org/10.7567/SSDM.2021.H-6-06

2021 International Conference on Solid State Devices and Materials

[H-6-06] Universal Method on Charge Carrier Mobility and Series Resistance Extraction in Two-Dimensional Field-Effect Transistors