Fast and Reliable Resistance Switching in Ca<sub>2</sub>RuO<sub>4</sub> Thin Films Driven by the Current-Induced Phase Transition

Keiji Tsubaki

doi:https://doi.org/10.7567/SSDM.2021.I-2-02

16:15 〜 16:22

[I-2-02] Fast and Reliable Resistance Switching in Ca₂RuO₄ Thin Films Driven by the Current-Induced Phase Transition

〇Keiji Tsubaki¹、Atsushi Tsurumaki-Fukuchi¹、Yasuo Takahashi¹、Takayoshi Katase²、Toshio Kamiya²、Masashi Arita¹ (1.IST, Hokkaido Univ.、2.MSL, Tokyo Tech.)

https://doi.org/10.7567/SSDM.2021.I-2-02

2021 International Conference on Solid State Devices and Materials

[I-2-02] Fast and Reliable Resistance Switching in Ca2RuO4 Thin Films Driven by the Current-Induced Phase Transition

[I-2-02] Fast and Reliable Resistance Switching in Ca₂RuO₄ Thin Films Driven by the Current-Induced Phase Transition