Fast and Reliable Resistance Switching in Ca<sub>2</sub>RuO<sub>4</sub> Thin Films Driven by the Current-Induced Phase Transition

Keiji Tsubaki, Atsushi  Tsurumaki-Fukuchi, Yasuo Takahashi, Takayoshi Katase, Toshio Kamiya, Masashi Arita

doi:https://doi.org/10.7567/SSDM.2021.I-2-02

4:15 PM - 4:22 PM

[I-2-02] Fast and Reliable Resistance Switching in Ca₂RuO₄ Thin Films Driven by the Current-Induced Phase Transition

〇Keiji Tsubaki¹, Atsushi Tsurumaki-Fukuchi¹, Yasuo Takahashi¹, Takayoshi Katase², Toshio Kamiya², Masashi Arita¹ (1.IST, Hokkaido Univ., 2.MSL, Tokyo Tech.)

https://doi.org/10.7567/SSDM.2021.I-2-02

2021 International Conference on Solid State Devices and Materials

[I-2-02] Fast and Reliable Resistance Switching in Ca2RuO4 Thin Films Driven by the Current-Induced Phase Transition

[I-2-02] Fast and Reliable Resistance Switching in Ca₂RuO₄ Thin Films Driven by the Current-Induced Phase Transition