16:36 〜 16:43

[J-2-05] Abnormal Negative Shift under Positive Bias Illumination Stress in Amorphous In-Ga-Zn-O Thin-Film Transistors

〇Pengfei - Wang¹、Yunfei Liu¹、Yunping Wang¹、Rongsheng Chen²、Zhihe Xia³、Sunbin Deng³、Man Wong³、Hoi Sing Kwok³、Shengdong Zhang¹、Lei Lu¹ (1.School of Electronic and Computer Engineering, Peking Univ., Shenzhen、2.School of Electronic and Information Engineering, South China Univ. of Techn., Guangzhou、3.State Key Laboratory of Advanced Displays and Optoelectronics Technologies, The Hong Kong Univ. of Sci. and Tech.)

https://doi.org/10.7567/SSDM.2021.J-2-05