[L-4-06] [No Show]IGZO thin-film transistor-based high-sensitivity pH sensor implemented by resistive coupling of coplanar gate structure

〇Seong-Kun Cho¹、Won-Ju Cho¹ (1.Kwangwoon Univ.)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 11:20 〜 11:27

[L-5-01 (Invited)] Digitalized Power Electronics for Incorporating IoT and AI

〇Makoto Takamiya¹ (1.The Univ. of Tokyo)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:00 〜 14:30 |PDF ダウンロード

[L-5-02] A 24V V_IN 5-to-20V V_OUT 10MHz 2-Phase GaN DC-DC Buck Converter with CF-AOOT Control for Wide Range Voltage Conversion Ratio

〇Motohiro Kanai¹、Ryuya Maki¹、Norifumi Matsuda¹、Kyohei Tanimura¹、Hidetoshi Taki¹、Kousuke Miyaji¹ (1.Shinshu Univ.)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:30 〜 14:37 |PDF ダウンロード

[L-5-03] A 17MHz Wide-band Isolated Current Sensor for D-mode GaN Half-bridge

〇Hideaki Majima¹、Hiroaki Ishihara²、Katsuyuki Ikeuchi¹、Toshiyuki Ogawa¹、Yuichi Sawahara¹、Tatsuhiro Ogawa¹、Satoshi Takaya²、Kohei Onizuka ²、Osamu Watanabe¹ (1.Toshiba Electronic Devices and Storage Corp.、2.Toshiba Corp.)

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:37 〜 14:44 |PDF ダウンロード

[L-5-04] Equivalent Circuit Modeling in GaN Wireless Power Transmission includingStray Inductance and Capacitance by measuring Radiated Emission

〇Toshihide Ide^1,2、Mitsuaki Shimizu²、Noriyuki Takada¹ (1.National Inst. of Advanced Indus. Sci. and Tech. (AIST)、2.AIST-NU GaN Advanced Device Open Innovation Lab. (GaN-OIL), National Inst. of Advanced Indus. Sci. and Tech. (AIST))

2021 International Conference on Solid State Devices and Materials |2021年9月8日(水) 14:44 〜 14:51 |PDF ダウンロード

[SC-Intro] Lecture movies and memorandum

2021 International Conference on Solid State Devices and Materials

[SC-01] Gate-All-Around Nanosheet CMOS Technology

Julien Frougier¹ (1.IBM)

2021 International Conference on Solid State Devices and Materials |2021年9月6日(月) 12:00 〜 12:45

[SC-02] Local-Stress Technologies with Dual Metal / High-K Gate CMOS

Masanori Tsukamoto¹ (1.Sony Semiconductor Solutions)

2021 International Conference on Solid State Devices and Materials |2021年9月6日(月) 12:45 〜 13:30

[SC-03] Process-Technology Challenges for Fin Structure

Digh Hisamoto¹ (1.Hitachi)

2021 International Conference on Solid State Devices and Materials |2021年9月6日(月) 13:30 〜 14:15

[SC-04] Advanced Process Technologies for Continuous Logic Scaling

Tomonari Yamamoto¹ (1.TEL)

2021 International Conference on Solid State Devices and Materials |2021年9月6日(月) 14:30 〜 15:15