Auger recombination coefficient in 4H-SiC under the high injection condition

Kazuhiro

doi:https://doi.org/10.7567/SSDM.2022.J-5-03

11:15 AM - 11:30 AM

[J-5-03] Auger recombination coefficient in 4H-SiC under the high injection condition

〇Kazuhiro "-" TANAKA¹, Keisuke NAGAYA¹, Masashi KATO¹ (1. Nagoya Institute Technology (Japan))

Presentation style: Online

https://doi.org/10.7567/SSDM.2022.J-5-03

We observed carrier recombination in 4H-SiC under the high injection condition by time resolved free carrier absorption measurements. Based on the observed decay curves, we estimated the Auger recombination coefficient. As a result, we found dependence of the Auger recombination coefficient on the excited carrier density.

2022 International Conference on Solid State Devices and Materials

[J-5-03] Auger recombination coefficient in 4H-SiC under the high injection condition