11:15 AM - 11:30 AM
[A-4-03] Strong Gate Modulation Effect in Nanoscale TiN Channels
Huge modulation rate of TiN channel resistance has been achieved at room temperature. The nanowire channels are fabricated on ALD-prepared 3-nm-thick TiN film with e beam lithography and dry etching. By shrinking the channel width, a resistance modulation rate of up to 220.49% has been obtained with the back-gated nanowires. An anomalous non-linear I-V curve is observed and discussed.
