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[B-6-05] Novel WN x/C Interfacial Layer on Hf 0.5Zr 0.5O 2 Ferroelectric Memory
A carbon (C) interfacial layer (IL) in Ru/WNx/C/Hf0.5Zr0.5O2(HZO)/TiN capacitor shows less fatigue than the device with WNx IL after 108 cycles under ±2 MV/cm and a 2Pr of 14.5 µC/cm2 after 10 years of retention. The WNx/C IL memory shows enhanced 2Pr value than pure Ru electrode owing to controlling oxygen vacancy in HZO film, which is useful for future low power non-volatile memory application.
