Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials

NTUMBA LOBO

doi:https://doi.org/10.7567/SSDM.2023.C-2-01

4:00 PM - 4:15 PM

[C-2-01] Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials

^○NTUMBA LOBO¹, Gebhard Josef Matt², Andres Osvet², Shreetu Shrestha², Levchuk Ievgen², Andrii Kanak³, Petro Fochuk³, Christoph J Brabec², Masashi Kato¹ (1. Nagoya Inst. of Tech (Japan), 2. Friedrich-Alexander Universität Erlangen-Nürnberg (Germany), 3. Yuriy Fedkovych Chernivtsi National Univ. (Ukraine))

https://doi.org/10.7567/SSDM.2023.C-2-01

We performed carrier lifetime measurements in metal halide perovskite materials using a microwave photoconductivity decay method with a continuous-wave laser. Illumination of the continuous wave laser mitigated effects of carrier trapping, the measured carrier lifetime will be similar to those in solar cell operation. As a result, we were able to mitigate the trapping effects in carrier lifetime measurements for MAPbI₃.

2023 International Conference on Solid State Devices and Materials

[C-2-01] Mitigation of Carrier Trapping Effects on Carrier Lifetime Measurements with Continuous-Wave Laser Illumination for Metal Halide Perovskite Materials