The Japan Society of Applied Physics

2023 International Conference on Solid State Devices and Materials

2023 International Conference on Solid State Devices and Materials

Sep 5, 2023 - Oct 31, 2023
Nagoya Congress Center

11:00 AM - 11:15 AM

[F-4-02] New module and sensor optic design to reduce petal flare in CMOS image sensor

○Hye Yeon Park1, Sang-In Bae1, Yunki Lee1, Tao Feng2, Tong Cheng2, Peide Li2, Wei Zhang2, Baotan Jiang2, Jinmyoung Mok1, Younggyu Jeong1, Kyoungyong Choi1, Bumsuk Kim1, Jungchak Ahn1 (1. Samsung Electronics (Korea), 2. vivo Communication Technology Co. Ltd (China))

https://doi.org/10.7567/SSDM.2023.F-4-02

Petal flares occur when diffracted light from the pixel array of the CMOS image sensor (CIS) reflects the surface of the infrared cut filter and the module lens and forms an abnormal image. The petal flare damages the overall quality, so it needs to be improved by changing both module and sensor optic system. To suggest new optic system, numerical modeling by flare simulation based on light optics and BRDF measurement are performed, and flare index was developed to indicate the degree of flare visibility. A module design and a new pixel structure with periodic control are suggested and it is verified that the new structure improves both flare visibility and flare index.