09:15 〜 09:30
[H-5-02] Ferroelectric Properties Tuning in Hf 0.5Zr 0.5O 2 Thin Films via Controlling the Crystal Orientations of Single-crystalline TiN Substrates
This work demonstrates the successful tuning of ferroelectric (FE) properties of Hf0.5Zr0.5O2 (HZO) thin films via controlling the crystal orientation of TiN substrates. The HZO films on TiN (111) and TiN (001) substrates exhibit substantially higher polarization than those on TiN (110). In addition, the films on single-crystalline TiN show stronger wake-up than those on polycrystalline TiN. The key to the tuning may be that the crystal orientation-tuned grain sizes affect the phase transition in FE phase formation as well as in switching cycling of polarization.
