The Japan Society of Applied Physics

11:45 AM - 12:00 PM

[K-4-03] Vertical-Channel Oxide Semiconductor FET with Off-State Leakage Current of 4.6 zA/μm

Masashi Oota1, Toshiki Hamada1, Minato Ito1, Toshiki Mizuguchi1, Hidetomo Kobayashi1, Takanori Matsuzaki1, Hiromi Sawai1, Hitoshi Kunitake1, Tatsuya Onuki1, Hajime Kimura1, Shunpei Yamazaki1 (1. Semiconductor Energy Laboratory Co., Ltd. (Japan))

https://doi.org/10.7567/SSDM.2023.K-4-03

By improving the structure of an oxide semiconductor field effect transistor (OSFET), an OSFET suitable for higher integration was fabricated while maintaining low off-state leakage current. Such an OSFET is called a vertical-channel OSFET (VFET), in which the direction of current flowing through a channel of the OSFET is vertical to the substrate. The VFET can reduce the footprint to as small as one channel hole, which is smaller than the conventional trench-gate self-aligned (TGSA) structure. In addition, the channel length of the VFET can be precisely controlled even when the channel length is short.