The Japan Society of Applied Physics

3:15 PM - 3:30 PM

[M-1-04] Sputtered β-Ga 2O 3 Crystallization by High Temperature Annealing on AlN/Si

Akira Sagawa1, Norikazu Ito1, Taketoshi Tanaka1, Ken Nakahara1 (1. ROHM Corp., Ltd. (Japan))

https://doi.org/10.7567/SSDM.2023.M-1-04

Generally, b-Ga2O3 epitaxial layers are grown on a bulk Ga2O3 substrate via halide vapor phase epitaxy. In this paper, we propose a low-cost method for Ga2O3 epitaxial growth on a Si substrate. The Ga2O3 layer was deposited on the Si substrate by sputtering with AlN grown via metal organic chemical vapor deposition. An orientated b-Ga2O3 could be confirmed owing to an annealing of the sputtered Ga2O3. Accordingly, Ga2O3 devices can be fabricated at a low cost.