11:30 AM - 11:45 AM
[N-6-03] Radiation Effects on 2DHG Diamond MOSFETs with Boron-doped Source and Drain Layers
The effect of X-ray irradiation up to 3 MGy on 2DHG diamond MOSFETs with heavily boron-doped source and drain layers was presented with the change of drain current density and shift of threshold voltage. The radio frequency performance of irradiated devices was also evaluated. After 3MGy irradiation, the cut-off frequency fT and maximum oscillating frequency fmax were 10.9 GHz and 12.4 GHz at VDS = -40 V and VGS = 16 V for a device with LSD = 2 μm.
