The Japan Society of Applied Physics

13:44 〜 13:46

[SO-PS-01-08] Double-Gated Ferroelectric-Gate Field-Effect-Transistor for Multi-Bit Content-Addressable Memories

Hongrui Zhang1, Jiajia Chen1, Chengji Jin1, Gaobo Lin1, Yan Liu2, Xiao Yu1, Genquan Han2 (1. Zhejiang Lab, Hangzhou 311121 (China), 2. Xidian University, Xi’an 710071 (China))

We have proposed a novel multi-bit content addressable memory (MCAM) cell based on one single double-gated ferroelectric-gate FET(DG-FeFET). Baseline DG-FeFET are modeled, and the parameters are calibrated with experimental results by technology computer aided design (TCAD). Thanks to the pairing opposite ferroelectric states of the top/bottom gate (TG/BG), and pairing opposite searching voltages applied to TG and BG, MCAM functions with one DG-FeFET are realized. The corresponding writing and searching operations are investigated in detail by the TCAD Sentaurus model. In addition, it is clarified that reducing the coupling effect of top and bottom channel by appropriately increasing the body thickness (Tbody) can boost the mismatch/match ratio. The proposed MCAM cell with one single DG-FeFET is promising for ultra-high-density computing systems