[Mo-P] Poster Presentation

[Mo-P-38] Dynamic Measurement Method to Extract High Voltage and High Current I-V Characteristics of SiC MOSFET with Reduced Self Heating

*Yohei Nakamura¹, Tatsuya Yanagi¹, Hiroyuki Sakairi¹, Naotaka Kuroda¹, Ken Nakahara¹ (1. ROHM Co., Ltd.(Japan))