[Mo-P] Poster Presentation

[Mo-P-47] Stress Test of Cascode Switch Using SiC Static Induction Transistor

Koji Yano¹, *Takashi Matsumoto¹, Yasunori Tanaka² (1. Univ. of Yamanashi(Japan), 2. National Inst. of Advanced Indus. Sci. and Tech.(Japan))