CLEO-PR2022/ISOM'22/ODF'22

講演情報

Oral Session

CLEO-PR2022 » Applied Metrology and Sensing

[CFP6J] Applied Metrology and Sensing

2022年8月5日(金) 15:30 〜 16:45 Room 204 (2F)

Session Chair: Tatsutoshi Shioda (Saitama Univ.)

16:15 〜 16:30

[CFP6J-04] Scatterometry using deep learning for analysis of oil including phosphor

*Tetsuya Hoshino1, Shintaro Narioka1, Sadao Aoki1, Masahide Itoh1, Masami Kobayashi2 (1. Inst. of Applied Physics., University of Tsukuba (Japan), 2. Inst. of Materials Science., University of Tsukuba (Japan))

[Presentation Style] Onsite

Deep learning was introduced to the scatterometry of isolated particles. We applied this method to oil droplets containing phosphors and analyzed the relationship between the amount of phosphor and the emission intensity.