Oral Presentation
Characterization and Defect Engineering
Fri. Oct 4, 2019 8:45 AM - 10:00 AM Annex Hall 2 (Kyoto International Conference Center)
8:45 AM - 9:15 AM
*Martin Albrecht1, R. Schewski1, C. Wouters1, A. Fielder1, K. Irmscher1, Z. Galazka1, S. Bin Anooz1, M. Baldini1, A. Popp1 (1. Leibniz-Institut für Kristallzüchtung(Germany))
Schedule
9:15 AM - 9:30 AM
*Giovanni Alfieri1, Philippe Godignon2, Andrei Mihaila1, Lasse Vines3 (1. ABB(Switzerland), 2. CNM(Spain), 3. Oslo Univ.(Norway))
Schedule
9:30 AM - 9:45 AM
*Masashi Kato1, Tomohiro Ambe1 (1. Nagoya Inst. of Tech.(Japan))
Schedule
9:45 AM - 10:00 AM
Shojan P. Pavunny1, *Rachael L Myers-Ward1, D. K. Gaskill1, Edward Bielejec2, Hunter Banks1, Andrew L. Yeats1, Matthew T. DeJarld3, Samuel Carter1 (1. US Naval Research Laboratory(United States of America), 2. Sandia National Laboratories(United States of America), 3. Raytheon(United States of America))
Schedule
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