Schedule 3 3:45 PM - 5:45 PM [Mo-P-47] Stress Test of Cascode Switch Using SiC Static Induction Transistor Koji Yano1, *Takashi Matsumoto1, Yasunori Tanaka2 (1. Univ. of Yamanashi(Japan), 2. National Inst. of Advanced Indus. Sci. and Tech.(Japan))
