[We-P] Poster Presentation

[We-P-29] A Comparison of Active Near-Interface Traps in Nitrided and As-Grown Gate Oxides by the Direct Measurement Technique

*PEYUSH PANDE¹, Sima Dimitrijev¹, Daniel Haasmann¹, Hamid Amini Moghadam¹, Philip Tanner¹, Jisheng Han¹ (1. Queensland Micro- and Nanotechnology Center, Griffith University(Australia))