Poster presentation

[14p-PB9-1~4] 7.2 Applications and technologies of electron beams

Mon. Sep 14, 2015 6:30 PM - 8:30 PM PB9 (Shirotori Hall)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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6:30 PM - 8:30 PM

[14p-PB9-1] In situ HVEM observation of photo corrosion of ZnO nano-crystals in ionic liquid

〇Kazuma Kogure¹, Kosuke Ofuji¹, Junya Ishioka², Jeem Melbert¹, Mirza Rafiq¹, Kaede Kawaguchi¹, Shigeo Yatu², Tamaki Shibayama², Seiichi Watanabe² (1.Hokkaido Univ. Graduate School of Engineering, 2.Hokkaido Univ. CAREM)

6:30 PM - 8:30 PM

[14p-PB9-2] Analysis of the coke distribution of the zeolite by using FE-SEM

〇Yoshihisa Orai¹, Takeshi Sunaoshi¹, Satoshi Okada¹, Toshiyuki Yokoi² (1.Hitachi High-tech, 2.Tokyo Tech)

6:30 PM - 8:30 PM

[14p-PB9-3] Formation of higher-order facet structures for novel NEA electron emissive surface

〇Kazutoshi Matsuo¹, Masayuki Hirao¹, Shota Tanaka¹, Hokuto Iijima¹, Takao Shiokawa², Takashi Meguro¹ (1.Tokyo University of Science, 2.Institute of Physical and Chemical Research)

6:30 PM - 8:30 PM

[14p-PB9-4] PIC-FDTD analysis of the enhancement of Smith-Purcell radiation due to cavity effect

〇(M1)yuya sato¹, Oka Hisaki² (1.Niigata Univ., 2.Niigata University)

Oral presentation

[15p-4E-1~23] 7.2 Applications and technologies of electron beams

Tue. Sep 15, 2015 1:15 PM - 7:30 PM 4E (437)

座長:村田英一(名城大),嶋脇秀隆(八戸工大)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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1:15 PM - 1:30 PM

[15p-4E-1] [Young Scientist Presentation Award Speech] Li analysis of Li-compounds using AES and REELS methods

〇Noboru Taguchi¹, Mitsunori Kitta¹, Hikari Sakaebe¹, Tomoki Akita¹ (1.AIST)

1:30 PM - 1:45 PM

[15p-4E-2] STEM study on Au/CeO₂ interface

〇Tomoki Akita¹, Yasushi Maeda¹, Taguchi Noboru¹, Shingo Tanaka¹, Masanori Kohyama¹ (1.AIST RIECEN)

1:45 PM - 2:00 PM

[15p-4E-3] Formation of stable nano-pores in bilayer graphene sheets

〇(D)EMI KANO^1,2, Ayako Hashimoto^1,2, Masaki Takeguchi^1,2 (1.Univ. Tsukuba, 2.NIMS)

2:00 PM - 2:15 PM

[15p-4E-4] Dynamic Observation of Water Droplets with Liquid-cell Environmental TEM

〇Tadahiro Kawasaki^1,2, Takafumi Ishida^2,3, Takayoshi Tanji^2,3 (1.JFCC, 2.Nagoya Univ., 3.GREEN)

2:15 PM - 2:30 PM

[15p-4E-5] Observation of bulk materials using atmospheric scanning electron microscope

〇minami shoji¹, Yusuke Ominami¹, Shinsuke Kawanishi¹, Makoto Nakabayashi¹, Sukehiro Ito¹ (1.Hitachi Hightech Crop.)

2:30 PM - 2:45 PM

[15p-4E-6] Observation of pn Junctions in Semiconductors using Fountain Detector

〇Takashi Sekiguchi¹, Hideo Iwai¹, Takashi Kimura¹ (1.NIMS)

2:45 PM - 3:00 PM

△ [15p-4E-7] Development of electrostatic Cs-corrector with annular and circular electrodes (Simulations)

〇Yasuyuki Takai¹, Yuki Ogawa¹, Tadahiro Kawasaki^2,3, Takafumi Ishida³, Tetsuji Kodama¹, Takashi Ikuta⁴ (1.Meijo Univ., 2.JFCC, 3.EcoTopia Sci. Inst., Nagoya Univ, 4.Osaka Electro-Communication Univ)

3:00 PM - 3:15 PM

△ [15p-4E-8] Development of electrostatic Cs-corrector with annular and circular electrodes (experiments)

〇Yuki Ogawa¹, Yasuyuki Takai¹, Tadahiro Kawasaki^2,3, Takafumi Ishida³, Tetsuji Kodama¹, Takashi Ikuta⁴ (1.Meijo Univ, 2.JFCC, 3.EcoTopia Sci Inst, Nagoya Univ, 4.Osaka Electro-Communication Univ)

3:15 PM - 3:30 PM

△ [15p-4E-9] Development of Modulation Transmission Electron Microscope System with Focus Tracking Function

〇(D)Takahiro Tamura¹, Yoshihide Kimura¹, Yoshizo Takai¹ (1.Osaka Univ.)

3:30 PM - 3:45 PM

△ [15p-4E-10] Differential phase-contrast microscopy by a Hilbert phase-plate using the Aharonov-Bohm effect

〇Takafumi Ishida^1,2, Wei Li¹, Takayoshi Tanji^1,2 (1.Nagoya Univ., 2.GREEN)

Break （3:45 PM - 4:00 PM）

4:00 PM - 4:15 PM

[15p-4E-11] Resolution measurement of evaluation instrument for multi-emitter with a magnetic-field-superposed objective lens

〇(M2)Hiroki Takasu¹, Asai Daisei¹, Murata Hidekazu¹, Rokuta Eiji¹, Shimoyama Hiroshi¹ (1.Meijo Univ.)

4:15 PM - 4:30 PM

[15p-4E-12] Simulation of Surface Potential Forming Process under Electron Beam Irradiation

〇(M1)AKIHIRO FUKUZAWA¹, MASATOSHI KOTERA¹ (1.OIT)

4:30 PM - 4:45 PM

[15p-4E-13] Dependence of fogging electron by electron beam exposure on the bias-voltage

〇(M1)Masasi Tokai¹, Yuki Handa¹, Takuya Kawamoto¹, Masatoshi Kotera¹ (1.Osaka Institute of Technology)

4:45 PM - 5:00 PM

[15p-4E-14] Simulation of Fogging Electron Trajectories in Scanning Electron Microscope

〇Taiki Nishino¹, Kotera Masatoshi¹ (1.OIT)

5:00 PM - 5:15 PM

[15p-4E-15] Dependence of Fogging Electron Current at a Specimen Surface
On The Bias-voltage

〇(M1)TAKU NODA^1,2, Yoshifumi Hagiwara¹, Masatoshi Kotera¹, Raynald Gauvin² (1.OIT, 2.Mcgill Univ)

5:15 PM - 5:30 PM

[15p-4E-16] Field Ion Microscope Observation of Glycine Deposited Tungsten Emitter

〇noriaki nyuba¹, makoto okada¹, hiroshi tsuji¹, yasuhito gotoh¹ (1.Kyoto Univ.)

5:30 PM - 5:45 PM

[15p-4E-17] Field Emission from Molybdenum Surface with Thin Yttrium Oxide Layer

〇Takashi Kawakubo¹, Kitani Tsubasa¹, Nakane Hideaki² (1.NIT, Kagawa College, 2.Muroran Inst. of Tech.)

5:45 PM - 6:00 PM

[15p-4E-18] Fabrication of GOS (Graphene/Oxide/Semiconductor) type electron emission devices

〇Katsuhisa Murakami^1,2, Akira Miyashita^1,2, Shunsuke Tanaka^1,2, Xizi Gu^1,2, Takuya Iijima¹, Masayoshi Nagao³, Jun-ichi Fujita^1,2 (1.Univ. Tsukuba, 2.TIMS, 3.AIST)

Break （6:00 PM - 6:15 PM）

6:15 PM - 6:30 PM

[15p-4E-19] Activation process of GaAs NEA cathode and energy distribution of emitted electrons

〇(M1)Keigo Mitsuno¹, Tomoaki Masuzawa¹, Yoshinori Hatanaka¹, Yoichiro Neo¹, Hidenori Mimura¹ (1.Shizuoka Univ.)

6:30 PM - 6:45 PM

[15p-4E-20] Beam focusing characteristics of volcano-structured double-gate Spindt-type field emitter arrays

〇Masayoshi Nagao¹, Yasuhito Gotoh², Tomoaki Masuzawa³, Yoichiro Neo³, Hidenori Mimura³ (1.AIST, 2.Kyoto Univ., 3.Shizuoka Univ.)

6:45 PM - 7:00 PM

[15p-4E-21] Electric field and electrode geometry of double-gated Spindt-type field emitter array

〇Yasuhito Gotoh¹, Hiroshi Tsuji¹, Masayoshi Nagao² (1.Kyoto Univ., 2.AIST)

7:00 PM - 7:15 PM

▲ [15p-4E-22] Stability of Discharge Characteristics of Nanometer-order Size Transfer Mold Field Emitter Arrays for Plasma Source Applications

〇JONGHYUN MOON¹, Masayuki Nakamoto¹ (1.Shizuoka Univ.)

7:15 PM - 7:30 PM

[15p-4E-23] Electron ray tracing from Field Emitter Array on the basis of its current density distribution

〇Hiroyasu Goto¹, Hidekazu Murata¹, Hiroshi Shimoyama¹ (1.Meijo Univ.)

Sessions

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[14p-PB9-1~4] 7.2 Applications and technologies of electron beams

[14p-PB9-1] In situ HVEM observation of photo corrosion of ZnO nano-crystals in ionic liquid

[14p-PB9-2] Analysis of the coke distribution of the zeolite by using FE-SEM

[14p-PB9-3] Formation of higher-order facet structures for novel NEA electron emissive surface

[14p-PB9-4] PIC-FDTD analysis of the enhancement of Smith-Purcell radiation due to cavity effect

[15p-4E-1~23] 7.2 Applications and technologies of electron beams

[15p-4E-1] [Young Scientist Presentation Award Speech] Li analysis of Li-compounds using AES and REELS methods

[15p-4E-2] STEM study on Au/CeO₂ interface

[15p-4E-3] Formation of stable nano-pores in bilayer graphene sheets

[15p-4E-4] Dynamic Observation of Water Droplets with Liquid-cell Environmental TEM

[15p-4E-5] Observation of bulk materials using atmospheric scanning electron microscope

[15p-4E-6] Observation of pn Junctions in Semiconductors using Fountain Detector

△ [15p-4E-7] Development of electrostatic Cs-corrector with annular and circular electrodes (Simulations)

△ [15p-4E-8] Development of electrostatic Cs-corrector with annular and circular electrodes (experiments)

△ [15p-4E-9] Development of Modulation Transmission Electron Microscope System with Focus Tracking Function

△ [15p-4E-10] Differential phase-contrast microscopy by a Hilbert phase-plate using the Aharonov-Bohm effect

[15p-4E-11] Resolution measurement of evaluation instrument for multi-emitter with a magnetic-field-superposed objective lens

[15p-4E-12] Simulation of Surface Potential Forming Process under Electron Beam Irradiation

[15p-4E-13] Dependence of fogging electron by electron beam exposure on the bias-voltage

[15p-4E-14] Simulation of Fogging Electron Trajectories in Scanning Electron Microscope

[15p-4E-15] Dependence of Fogging Electron Current at a Specimen Surface
On The Bias-voltage

[15p-4E-16] Field Ion Microscope Observation of Glycine Deposited Tungsten Emitter

[15p-4E-17] Field Emission from Molybdenum Surface with Thin Yttrium Oxide Layer

[15p-4E-18] Fabrication of GOS (Graphene/Oxide/Semiconductor) type electron emission devices

[15p-4E-19] Activation process of GaAs NEA cathode and energy distribution of emitted electrons

[15p-4E-20] Beam focusing characteristics of volcano-structured double-gate Spindt-type field emitter arrays

[15p-4E-21] Electric field and electrode geometry of double-gated Spindt-type field emitter array

▲ [15p-4E-22] Stability of Discharge Characteristics of Nanometer-order Size Transfer Mold Field Emitter Arrays for Plasma Source Applications

[15p-4E-23] Electron ray tracing from Field Emitter Array on the basis of its current density distribution

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