The 62nd JSAP Spring Meeting, 2015

Presentation information

Poster presentation

15 Crystal Engineering » 15.5 Group IV crystals and alloys

[12p-P17-1~7] 15.5 Group IV crystals and alloys

Thu. Mar 12, 2015 4:00 PM - 6:00 PM P17 (Gymnasium)

4:00 PM - 6:00 PM

[12p-P17-2] Detection of Effect of Strain and Composition on the Valence Band of SiGe by HXPES with High Spatial Resolution and XPS

〇Shunta Yamahori1, Tomoya Sasago1, Eisuke Yonekura1, Kentarou Sawano1, Eiji Ikenaga2, Hiroshi Nohira1 (1.Tokyo City Univ., 2.JASRI)

Keywords:XPS,SiGe,Uniaxial Strain