[16a-Z26-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

▲ [16a-Z26-6] Controlling impedance matching in RF reflectometry measurement of quantum dot via FPGA

〇Hiroki Takahashi¹, Sinan Bugu¹, Tetsuo Kodera¹ (1.Tokyo tech.)

Keywords:quantum dot, FPGA

Silicon quantum dots are a promising candidate for quantum computation thanks to its long coherence time and compatibility with CMOS technology. However, Devices with a global top gate can disturb impedance matching in RF reflectometry measurement.
In this study, we will show good impedance matching which is controlled via FPGA.