[16a-Z32-1~10] 22.1 Joint Session M "Phonon Engineering"

[16a-Z32-6] Correlation between thermal conductivity and persistent homology in amorphous Si

〇Emi Minamitani¹, Takuma Shiga², Ippei Obayashi³, Makoto Kashiwagi⁴ (1.IMS, 2.UTokyo, 3.RIKEN, 4.AGU)

Keywords:Amorphous Si, thermal conductivity, persistent homology

The decrease of lattice thermal conductivity in amorphous materials is originated from the scattering of phonons by structural disorders. However, it has been difficult to discuss the relationship between structural properties and thermal conductivity. In this study, we applied the persistent homology group, which is one of the techniques to extract topology in various numerical data, to investigate whether there is a correlation between topological information and thermal conductivity in amorphous Si.