The 68th JSAP Spring Meeting 2021

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[17p-Z16-1~8] 7.2 Applications and technologies of electron beams

Wed. Mar 17, 2021 1:30 PM - 3:30 PM Z16 (Z16)

Takashi Kawakubo(Natl. Inst. of Tech., Kagawa College), Takafumi Ishida(Nagoya University)

3:00 PM - 3:15 PM

[17p-Z16-7] In-situ observation of electro-deposition and stripping of lead using a high-resolution scanning electron microscope with an electrochemical cell

Gada He1, Yoshifumi Oshima1, Masahiko Tomitori1 (1.JAIST)

Keywords:scanning electron microscopy, electrochemical cell, electro-deposition and stripping

We developed an electrochemical cell for in-situ SEM observation and acquired in-situ consecutive SEM images of electro-deposition and stripping of Pb on the Au electrode through the SiN membrane window while measuring the cyclic voltammogram. The SEM images clearly showed that the electro-deposition and stripping of Pb on a nanoscale, which were consistent with the cyclic voltammogram curves. From the SEM observation, we distinguish the growth modes of Pd deposits, exhibiting the particulate band structures and dendrite structures, depending on the roughness of the electrode. The brightness of SEM images in the electrolyte region changed in the course of the cyclic voltammetry, which implied the change of Pb concentration of the electrolyte near the electrode. This study demonstrated the potential of in-situ high-resolution SEM combined with the electrochemical cell.