The 68th JSAP Spring Meeting 2021

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power electron devices and process technology

[19p-Z25-1~14] 13.7 Compound and power electron devices and process technology

Fri. Mar 19, 2021 1:00 PM - 4:45 PM Z25 (Z25)

Masashi Kato(Nagoya Inst. of Tech.)

3:00 PM - 3:15 PM

[19p-Z25-8] Performance of heterojunction transistor consisting of GaAs or InGaAs channel with electrons and holes induced by modulation doping

〇(M2)Hiroaki Ogawa1, Mayu Toyohara1, Keita Asaka1, Naotaka Iwata1 (1.Toyota Tech. Inst.)

Keywords:superjunction, high breakdown voltage, heterojunction

We previously reported high breakdown characteristics for GaAs heterostructure superjunction diodes with a pair of channel-doped electrons and holes. For a lower on-resistance, we investigated modulation-doped devices consisting of AlGaAs barrier sandwiched with GaAs or InGaAs channel. The InGaAs channel transistor derived a 104 Ω·mm on-resistance with 23 µm gate-drain spacer. It also showed a 400 V high breakdown voltage. Compared with the channel-doped transistor, the developed InGaAs channel modulation-doped one can reduce the on-resistance with high breakdown voltage.