[2Ba02-13] SPM Division's Session

[2Ba13] Development of scanning diamond NV center probe microscopy

*Toshu An¹ (1. Japan Advanced Institute of Science and Technology)

The NV center: defect center in a diamond can be attached at the apex of an atomic force microscope (AFM) enabling nanoscale quantum sensing and imaging. We introduce NV probe fabrication using laser cutting and focused ion beam fabrication. The magnetic tape sample, where periodic magnetic domain structures were formed to demonstrate stray magnetic field sensing and imaging via optically detected magnetic resonance mapping synchronized with AFM topographic imaging.