[A4-PR15] Slot 15

[A4-PR15-01] Nanoscale Crystal Orientation Analysis of Highly Textured NdFeAs(O,F) Films on Technical Substrates

*Zimeng Guo^1,2, Hongye Gao¹, Keisuke Kondo³, Takafumi Hatano^2,3, Kazumasa Iida^2,3, Jens Hänisch⁴, Hiroshi Ikuta³, Satoshi Hata^1,2 (1. Kyushu Univ. (Japan), 2. JST CREST (Japan), 3. Nagoya Univ. (Japan), 4. Karlsruhe Institute of Technology (Germany))

キーワード：Fe-based superconductor, epitaxial thin film, in-field critical current density, triple junction