[H5-O8] Slot 08

[H5-O8-05] Ion Track Formation in Crystalline Silicon under MeV C₆₀ Ion Irradiation with Much Lower Energy Deposition than the Threshold

*Hiroshi Amekura¹, Kazumasa Narumi², Atsuya Chiba², Yoshimi Hirano², Keisuke Yamada², Shunya Yamamoto², Norito Ishikawa³, Nariaki Okubo³, Yuichi Saitoh² (1. Nat. Inst. for Mater. Sci. (NIMS) (Japan), 2. Nat. Inst. for Quantum & Radiological Sci. & Tech. (QST) (Japan), 3. Japan Atomic Energy Agency (JAEA) (Japan))

キーワード：ion track, C60 cluster ion, synergy effect, swift heavy ion, silicon