The Japan Society of Applied Physics

16:45 〜 17:00

[F-2-04] Estimation of Seebeck Coefficient of Si Wire Laterally Lying on Oxide-Covered Substrate

〇Kazuaki Katayama1, Md Mehdee Hasan Mahfuz1, Motohiro Tomita1, Shuhei Hirao1, Sakika Tanabe1, Takashi Matsukawa2, Takeo Matsuki1,2, Hiroshi Inokawa3, Hiroya Ikeda3, Takanobu Watanabe1 (1. Waseda University(Japan), 2. AIST(Japan), 3. Shizuoka University(Japan))

https://doi.org/10.7567/SSDM.2020.F-2-04